作者: Ran Jin , Chia-Jung Chang , Jianjun Shi
DOI: 10.1080/0740817X.2011.557030
关键词: Mean squared prediction error 、 Quality management 、 Feature estimation 、 Flatness (systems theory) 、 Semiconductor industry 、 Algorithm 、 Gaussian process 、 Wafer 、 Reliability engineering 、 Engineering 、 Ensure (product)
摘要: … measurement strategy to reduce the number of samples measured in wafers while still … However, a major limitation of these sampling strategies is that the local spatial variability in …