作者: Clemens Barth
DOI: 10.1007/978-3-319-14367-5_7
关键词: Atomic force microscopy 、 Atomic resolution 、 Materials science 、 Kelvin probe force microscope 、 Spectroscopy 、 Optoelectronics 、 Volta potential 、 Electrostatic force microscope 、 Microscopy
摘要: In this chapter, noncontact AFM (nc-AFM) work concerning defects on the native MgO(001) surface is reviewed. Due to their relevance Electrostatic force microscopy (EFM) and Kelvin probe (KPFM) are first introduced. Experimental spectroscopy curves images then discussed compared with results from theory, focus atomic resolution defect identification.