TEM and X-ray diffraction investigation of the structural characteristics of the microporous oxide film formed on polycrystalline Ti
作者： J.-P Gueneau de Mussy , G Langelaan , J Decerf , J.-L Delplancke
DOI: 10.1016/S1359-6462(02)00323-8
关键词: Chemical engineering 、 Materials science 、 Crystallite 、 Anatase 、 Rutile 、 Substrate (electronics) 、 Layer (electronics) 、 Microporous material 、 Optics 、 Oxide 、 X-ray crystallography
摘要: Abstract The microporous TiO 2 layer in the vicinity of Ti–TiO interface is formed by a great amount tiny crystallites. Bigger anatase and rutile crystals stand outer region oxide. orientation proportion influenced underlying textured Ti substrate.
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