作者: W. A. Scrivens , Y. Luo , M. A. Sutton , S. A. Collette , M. L. Myrick
DOI: 10.1007/S11340-006-5869-Y
关键词: Photolithography 、 Thin film 、 Digital image correlation 、 Surface metrology 、 Nanoscopic scale 、 Nanotechnology 、 Scanning electron microscope 、 Composite material 、 Profilometer 、 Microscale chemistry 、 Materials science
摘要: … and polymeric materials for use in shape and deformation … nominally uniform thin films of gold, silver, copper and chromium and … , the evaporation process does not provide high bonding …