Development of Patterns for Digital Image Correlation Measurements at Reduced Length Scales

作者: W. A. Scrivens , Y. Luo , M. A. Sutton , S. A. Collette , M. L. Myrick

DOI: 10.1007/S11340-006-5869-Y

关键词: PhotolithographyThin filmDigital image correlationSurface metrologyNanoscopic scaleNanotechnologyScanning electron microscopeComposite materialProfilometerMicroscale chemistryMaterials science

摘要: … and polymeric materials for use in shape and deformation … nominally uniform thin films of gold, silver, copper and chromium and … , the evaporation process does not provide high bonding …

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