Guided-mode resonance absorption in partly oxidized thin silver films
作者： H Libardi , H.P Grieneisen
DOI: 10.1016/S0040-6090(98)00820-7
关键词: Materials science 、 Total internal reflection 、 Analytical chemistry 、 Thin film 、 Resonance 、 Absorption (electromagnetic radiation) 、 Layer (electronics) 、 Surface plasmon resonance 、 Surface plasmon 、 Oxide
摘要: Abstract Partly oxidized Ag films deposited on glass substrates were found to exhibit significantly different reflectance properties for either s- or p-polarized incident light under conditions of total internal reflection. The measured reflectances depend strongly angle incidence and wavelength are sensitive functions the 2 O layer thicknesses. For pure slightly we observe evolution well known surface plasmon resonance, whereas with an increasing oxide a new resonance is observed in s-polarization. We account all these effects by modeling film as glass/Ag/Ag O/air system using recently published optical constants O.
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