Sulfurization temperature dependence of the structural transition in Cu2FeSnS4-based thin films
作者： Xiankuan Meng , Hongmei Deng , Lin Sun , Pingxiong Yang , Junhao Chu
DOI: 10.1016/J.MATLET.2015.09.013
关键词: Sputter deposition 、 Materials science 、 Raman spectroscopy 、 X-ray photoelectron spectroscopy 、 Analytical chemistry 、 Sputtering 、 Thin film 、 Stannite 、 Phase (matter) 、 Phase transition
摘要: Abstract Cu 2 FeSnS 4 (CFTS)-based thin films have been prepared on Mo-coated glass substrates by magnetron sputtering technique combined with a post-sulfurization processing. Energy dispersive X-ray measurement indicates that the Sn content decreases increasing sulfurization temperature, and all samples are in Cu-poor Fe-rich states. photoelectron spectroscopy diffraction show phases belong to CFTS no impure phase, e.g. SnS 3 , can be discovered films. However, exhibit phase transition behavior from rhodostannite stannite structure temperature. The frequency of A 1 mode is estimated 323.8 cm −1 using empirical model, which coincides experimental value as measured Raman spectra analysis. These results helpful understand properties CFTS-based
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