Sub-25-nm laboratory x-ray microscopy using a compound Fresnel zone plate
作者： Olov von Hofsten , Michael Bertilson , Julia Reinspach , Anders Holmberg , Hans M. Hertz
DOI: 10.1364/OL.34.002631
关键词: Optics 、 Zone plate 、 Microscope 、 Resolution (electron density) 、 Physics 、 Photon counting 、 Microscopy 、 X-ray optics 、 Fresnel zone 、 Stray light 、 Atomic and Molecular Physics, and Optics
摘要: Improving the resolution in x-ray microscopes is of high priority to enable future applications nanoscience. However, high-resolution zone-plate optics often have low efficiency, which makes implementation laboratory difficult. We present a microscope based on compound zone plate. The plate utilizes multiple diffraction orders achieve while maintaining reasonable efficiency. analyze illumination conditions necessary for this type order suppress stray light and demonstrate microscopic imaging resolving 25 nm features.
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