Direct Imaging of Integrated Circuits in CPU with 60 nm Super-Resolution Optical Microscope.
作者： Jinsong Xia , Guang Yang , Ping Wang , Yi Wang , Yuxi Wang
DOI: 10.1021/ACS.NANOLETT.1C00403
关键词: Chip 、 Demodulation 、 Integrated circuit 、 Central processing unit 、 Optical microscope 、 Resolution (electron density) 、 Microscope 、 Materials science 、 Signal 、 Optoelectronics
摘要: Far-field super-resolution optical microscopies have achieved incredible success in life science for visualization of vital nanostructures organized in single cells. However, such …
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