Electrical properties of γ-In2Se3 layers synthesized by solid state reaction between In and Se thin films
作者： J.C. Bernède , S. Marsillac , A. Conan
DOI: 10.1016/S0254-0584(97)80068-5
关键词: X-ray photoelectron spectroscopy 、 Grain boundary 、 Annealing (metallurgy) 、 Intermetallic 、 Thin film 、 Electrical resistivity and conductivity 、 Crystallite 、 Conductivity 、 Chemistry 、 Analytical chemistry 、 Mineralogy
摘要: … For economic reasons obtaining In2Se3 in thin film form is of … ) and X-ray photoelectron spectroscopy (XPS). It is shown that … XRD and XPS measurements of samples of each class. …
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