Specimen preparation technique for high resolution transmission electron microscopy studies on model supported metal catalysts
作者： J. W. M. Jacobs , J. F. C. M. Verhoeven
DOI: 10.1111/J.1365-2818.1986.TB02768.X
关键词: Analytical chemistry 、 Wafer 、 High-resolution transmission electron microscopy 、 Crystallite 、 Transmission electron microscopy 、 Thin film 、 Monolayer 、 Electron microscope 、 Silicon 、 Chemistry
摘要: SUMMARY A new technique is described which can be used for preparing transmission electron microscopy (TEM) specimens suitable high resolution studies on supported metal catalysts. By conventional silicon processing techniques 200 × μm2 Si3N4 membranes Si wafers are produced. These extremely flat and have a uniform thickness of 13 nm. They as support in various kinds thin film deposition. A TiO2 film, optimally structured with respect to the requirements TEM work TiO2–metal cluster systems, deposited layer. It consists one monolayer 10–25 nm crystallites. lattice images show that line down 0.19 possible. Examples TiO2–Pd TiO2–Rh given using respectively photodeposition impregnation reduction produce l.5–4 clusters.
sci-hub.se 参考文章(14)
Tetsuhiko Kobayashi, Yoshikuni Taniguchi, Hiroshi Yoneyama, Hideo Tamura, Effective surfaces of semiconductor catalysts for light-induced heterogeneous reactions evaluated by simultaneous photodeposition of both oxidation and reduction products The Journal of Physical Chemistry. ,vol. 87, pp. 768- 775 ,(1983) , 10.1021/J100228A015
B. E. Yoldas, Deposition and properties of optical oxide coatings from polymerized solutions Applied Optics. ,vol. 21, pp. 2960- 2964 ,(1982) , 10.1364/AO.21.002960
B. E. Yoldas, Monolithic glass formation by chemical polymerization Journal of Materials Science. ,vol. 14, pp. 1843- 1849 ,(1979) , 10.1007/BF00551023
A. V. Crewe, J. Wall, J. Langmore, Visibility of Single Atoms Science. ,vol. 168, pp. 1338- 1340 ,(1970) , 10.1126/SCIENCE.168.3937.1338
P FLYNN, The limitation of the transmission electron microscope for characterization of supported metal catalysts Journal of Catalysis. ,vol. 33, pp. 233- 248 ,(1974) , 10.1016/0021-9517(74)90267-X
R BAKER, Electron microscopy of supported metal particles: I. Behavior of Pt on titanium oxide, aluminum oxide, silicon oxide, and carbon Journal of Catalysis. ,vol. 56, pp. 390- 406 ,(1979) , 10.1016/0021-9517(79)90131-3
E. B. PRESTRIDGE, D. J. C. YATES, Imaging the Rhodium Atom with a Conventional High Resolution Electron Microscope Nature. ,vol. 234, pp. 345- 347 ,(1971) , 10.1038/234345A0
MMJ Treacy, A Howie, Contrast effects in the transmission electron microscopy of supported crystalline catalyst particles Journal of Catalysis. ,vol. 63, pp. 265- 269 ,(1980) , 10.1016/0021-9517(80)90079-2
W. W. Molzen, A. N. Broers, J. J. Cuomo, J. M. E. Harper, R. B. Laibowitz, Materials and techniques used in nanostructure fabrication Journal of Vacuum Science and Technology. ,vol. 16, pp. 269- 272 ,(1979) , 10.1116/1.569924
M. Avalos-Borja, M.J. Yacaman, On the visibility of small metallic particles on crystalline substrates Ultramicroscopy. ,vol. 10, pp. 211- 215 ,(1982) , 10.1016/0304-3991(82)90040-7