Structural stability of naphthyl end-capped oligothiophenes in organic field-effect transistors measured by grazing-incidence X-ray diffraction in operando
作者： Mathias K Huss-Hansen , Andreas E Lauritzen , Oier Bikondoa , Mika Torkkeli , Luciana Tavares
DOI: 10.1016/J.ORGEL.2017.07.012
关键词: Active layer 、 X-ray crystallography 、 Threshold voltage 、 Analytical chemistry 、 Structural stability 、 Crystallite 、 Diffraction 、 Monoclinic crystal system 、 Field-effect transistor 、 Optics 、 Materials science
摘要: We report on microstructural durability of 5, 5′-bis (naphth-2-yl)-2, 2′-bithiophene (NaT2) in organic field-effect transistors (OFETs) in operando monitored by grazing-incidence X-ray …
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