Ground-state-depletion fluorscence microscopy: A concept for breaking the diffraction resolution limit

作者: S. W. Hell , M. Kroug

DOI: 10.1007/BF01081333

关键词: RESOLFTLight sheet fluorescence microscopyOpticsScanning confocal electron microscopyGSD microscopySuper-resolution microscopyFluorescence correlation spectroscopyPhotoactivated localization microscopyMaterials scienceNear-field scanning optical microscope

摘要: We introduce and study a novel concept in farfield fluorescence microscopy fundamentally overcoming the classical diffraction resolution limit. This is accomlished by reducing spatial extent of effective focus scanning microscope. The reduction achieved depleting ground-state energy molecules located outer region focus. Our theoretical shows that ground-state-depletion has potential increasing far-field an order magnitude which equivalent to lateral 15 NM.

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