作者: S. W. Hell , M. Kroug
DOI: 10.1007/BF01081333
关键词: RESOLFT 、 Light sheet fluorescence microscopy 、 Optics 、 Scanning confocal electron microscopy 、 GSD microscopy 、 Super-resolution microscopy 、 Fluorescence correlation spectroscopy 、 Photoactivated localization microscopy 、 Materials science 、 Near-field scanning optical microscope
摘要: We introduce and study a novel concept in farfield fluorescence microscopy fundamentally overcoming the classical diffraction resolution limit. This is accomlished by reducing spatial extent of effective focus scanning microscope. The reduction achieved depleting ground-state energy molecules located outer region focus. Our theoretical shows that ground-state-depletion has potential increasing far-field an order magnitude which equivalent to lateral 15 NM.