作者: Hideo Sugiura , Toshio Nishida , Ryuzo Iga , Takeshi Yamada , Toshiaki Tamamura
DOI: 10.1016/0022-0248(92)90565-Z
关键词: Chemical beam epitaxy 、 Superlattice 、 Cathodoluminescence 、 Heterojunction 、 Chemistry 、 Crystal growth 、 Quantum wire 、 Chemical vapor deposition 、 Substrate (electronics) 、 Optics
摘要: Abstract Selective area growth of periodic InP/InGaAs heterostructure layers by chemical beam epitaxy are studied. The grown in windows ranging width from 0.1 to 5 μm under various substrate temperature and mask stripe direction conditions. Mesa-like structures bounded a (100) top surface two (111)B sidewalls selectively for InP InGaAs. An analysis the time evolution mesa cross-section areas reveals that 100% metalorganic molecules impinging on planes migrate plane facet growth, while only 40% them InGaAs growth. Cathodoluminescence measurement indicates peak wavelengths InGaAs/InP superlattice shift longer wavelength as window decreases. A 450 wide quantum wire is buried single step. simple model explaining mechanism also proposed.