Polarized neutron reflectometry study of thin Fe films prepared on V(100)
作者： Y.T Liu , H Fritzsche , J Hauschild , H Maletta
DOI: 10.1016/J.PHYSB.2004.03.056
关键词: Magnetization 、 Reflectometry 、 Neutron reflectometry 、 Electron diffraction 、 Materials science 、 X-ray reflectivity 、 Optics 、 Auger electron spectroscopy 、 Thin film 、 Magnetic moment 、 Analytical chemistry
摘要: Abstract The magnetic properties of ultrathin Fe (1 0 0) films were investigated by polarized neutron reflectometry (PNR). with different thicknesses from 1 to 3 nm prepared Molecular Beam Epitaxy (MBE) on a V buffer layer, which was deposited MgO single crystal. In order avoid oxidation the covered capping layers. During preparation process growth monitored low-energy electron diffraction (LEED) and Auger spectroscopy (AES). Combining information obtained PNR X-ray (XRR), layers determined precisely. From measurements absolute value magnetization could be fitting spin-up spin-down reflectivities separately. moments show perfect linear dependence film thickness t . line intersects abscissa at =(0.1±0.01) nm. This means that two V/Fe interfaces up as constant reduction moment equal an bulk layer
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