Reducing adhesion energy of micro-relay electrodes by ion beam synthesized oxide nanolayers

作者: Bivas Saha , Alexis Peschot , Benjamin Osoba , Changhyun Ko , Leonard Rubin

DOI: 10.1063/1.4978436

关键词: ElectrodeNanotechnologyAnnealing (metallurgy)OxideMaterials scienceThin layersChemical engineeringMetalIon beamRutheniumTungsten

摘要: Reduction in the adhesion energy of contacting metal electrode surfaces nano-electro-mechanical switches is crucial for operation with low hysteresis voltage. We demonstrate that by forming thin layers metal-oxides on metals such as Ru and W, can be reduced up to a factor ten. employ low-energy ion-beam synthesis technique subsequent thermal annealing form very (∼2 nm) (such RuO2 WOx) W quantify using an atomic force microscope microspherical tips.

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