作者: Bivas Saha , Alexis Peschot , Benjamin Osoba , Changhyun Ko , Leonard Rubin
DOI: 10.1063/1.4978436
关键词: Electrode 、 Nanotechnology 、 Annealing (metallurgy) 、 Oxide 、 Materials science 、 Thin layers 、 Chemical engineering 、 Metal 、 Ion beam 、 Ruthenium 、 Tungsten
摘要: Reduction in the adhesion energy of contacting metal electrode surfaces nano-electro-mechanical switches is crucial for operation with low hysteresis voltage. We demonstrate that by forming thin layers metal-oxides on metals such as Ru and W, can be reduced up to a factor ten. employ low-energy ion-beam synthesis technique subsequent thermal annealing form very (∼2 nm) (such RuO2 WOx) W quantify using an atomic force microscope microspherical tips.