Ion Scattering spectrometer with two analyzers preferably in tandem

作者: James T. Mckinney , Robert F. Goff

DOI:

关键词: Analytical chemistryIon beamSpectrometerHybrid mass spectrometerMass spectrometrySecondary ion mass spectrometryQuadrupole mass analyzerSpectrum analyzerChemistryIon

摘要: Improved apparatus and method for measuring ions scattered from a surface, to thereby determine the mass of atoms at surface. The includes two analyzers, preferably an energy analyzer positioned in tandem. may be tuned pass only having same as incident ion beam, reject sputtered ions, some which have requisite through under given set conditions.

参考文章(4)
Helmut Schillalies, Secondary ion mass spectroscopy ,(1973)
P. Smith David, F. Goff Robert, Elemental analyzing apparatus ,(1970)
M. Grundner, W. Heiland, E. Taglauer, Direct Comparison of Ion Scattering and Secondary Ion Emission as Tools for Analysis of Metal Surfaces Applied physics. ,vol. 4, pp. 243- 248 ,(1974) , 10.1007/BF00884235