作者: Davide Ferri , Thomas Bürgi , Alfons Baiker
DOI: 10.1021/JP002268I
关键词: Attenuated total reflection 、 Thin film 、 Infrared spectroscopy 、 Platinum 、 Adsorption 、 X-ray photoelectron spectroscopy 、 Absorption (chemistry) 、 Materials science 、 Catalysis 、 Analytical chemistry
摘要: Model platinum catalysts have been designed to study the platinum−solvent interface in situ using attenuated total reflection (ATR) infrared spectroscopy. Pt and Pt/Al2O3 thin films were evaporated on a Ge internal element (IRE) characterized by XRD, XPS, AFM, STM, IR Changes within adsorbate layer of catalyst during cleaning with O2 H2 followed. After cleaning, surface was probed CO adsorption from CH2Cl2. For film spectrum adsorbed showed band at 2000 cm-1, which is typical for catalysts. The stretching vibration linearly bonded exhibited coverage-dependent frequency shift due vibrational coupling, thus showing existence large clean domains reactive even presence an organic solvent. CH2Cl2 slow before process. However, subsequent admission resulted instantaneous drastic increase absorption ...