作者: Tao Sun , Weiwei Zheng , Yingjie Yu , Anand K. Asundi , Sergiy Valyukh
DOI: 10.1016/J.OPTLASENG.2018.11.008
关键词: Root mean square 、 Phase (waves) 、 Laser 、 Optics 、 Materials science 、 Fizeau interferometer 、 Noise (electronics) 、 Interference (wave propagation) 、 Interferometry 、 Wavelength
摘要: Abstract An interferogram obtained from a transparent plate contains information about the profiles of both surfaces plate. This can be extracted by processing fringe patterns measured at different wavelengths. The conventional Fourier analysis applied to solve such problems for set restricted number is quite sensitive error detuning wavelength shifting and suffers interference noise. study proposes method finding surface using series phase shifts caused changes. data treatment based on analytical approach describing spatial distributions irradiance in patterns. results show that proposed feasible. experimental setup used herein was Fizeau interferometer with tunable laser. A glass approximately 1 cm thick as test sample. According results, root mean square (RMS) errors determining did not exceed 2.3 nm.