作者: R. Vallée , P. Damman , M. Dosière , E. Toussaere , J. Zyss
DOI: 10.1063/1.481689
关键词: Materials science 、 Analytical chemistry 、 Ellipsometry 、 Substrate (electronics) 、 Crystal growth 、 Infrared spectroscopy 、 Thin film 、 Tetrafluoroethylene 、 Context (language use) 、 Nonlinear optics
摘要: The growth of 4-(N,N-dimethylamino)-3-acetamidonitrobenzene (DAN) crystals on nanostructured poly(tetrafluoroethylene) (PTFE) substrates has been investigated by means x-ray, micro-FTIR (Fourier-transform infrared) and nonlinear optical ellipsometry techniques. Two types structural arrangements were identified, depending conditions. In both cases, the (001)DAN plane contacts (100)PTFE substrate plane. major difference between samples lies in degree azimuthal orientation at interface. For thin (thickness 1 μm) are characterized a uniaxial with an isotropic random distribution layers. comparison various techniques used this study to characterize obtained films showed remarkable agreement. context, ...