作者: Yu. A. Boikov , T. Claeson , D. Erts , F. Bridges , Z. Kvitky
DOI: 10.1103/PHYSREVB.56.11312
关键词: Epitaxy 、 Thin film 、 Condensed matter physics 、 Diffraction 、 Valence (chemistry) 、 Superconductivity 、 X-ray crystallography 、 Crystallography 、 Crystal structure 、 Materials science 、 Transition temperature
摘要: High-quality superconducting (T{sub c}{approx}90K, j{sub c}{gt}10{sup 6}A/cm{sup 2} at 77 K) epitaxial (001) YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} films were grown by laser ablation on CeO{sub 2}/(11{underscore}02) Al{sub 2}O{sub 3}. An interaction between and would influence the structure parameters. A marked degradation of transition temperature c}=74K) was observed when twenty 2-nm-thick layers inserted equidistantly into a film (200 nm). BaCeO{sub 3} crystalline inclusions detected x-ray diffraction. X-ray-absorption fine-structure investigations Cu-K edge indicate that Ce substitutes for Y in 7{minus}{delta}}. Near-edge x-ray-absorption studies valence incorporated regions multilayer is also +4. {copyright} {ital 1997} The American Physical Society}