Czochralski growth and characterization of piezoelectric single crystals with langasite structure: La3Ga5SiO14 (LGS), La3Ga5.5Nb0.5O14 (LGN), and La3Ga5.5Ta0.5O14 (LGT): Part I
作者： J. Bohm , R.B. Heimann , M. Hengst , R. Roewer , J. Schindler
DOI: 10.1016/S0022-0248(99)00186-4
关键词: Characterization (materials science) 、 Etching (microfabrication) 、 Conductivity 、 Piezoelectricity 、 Etch pit density 、 Optoelectronics 、 Electrical resistivity and conductivity 、 Crystal 、 Dislocation 、 Mineralogy 、 Materials science
摘要: … 3 Ga 5.5 Nb 0.5 O 14 , LGN) crystals, initially langasite seeds cut in c-… LGN crystals showed likewise {1 0 1 ̄ 0} facets and were, like langasite, free of macroscopic defects. All crystals …
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