作者: L. Gaouyat , Z. He , J.-F. Colomer , Ph. Lambin , F. Mirabella
DOI: 10.1016/J.SOLMAT.2013.10.009
关键词: Sputter deposition 、 Absorption (electromagnetic radiation) 、 Materials science 、 Nanostructure 、 Substrate (electronics) 、 Cermet 、 Emissivity 、 Solar energy 、 Aluminium 、 Optics 、 Optoelectronics
摘要: … HRTEM, SAED and HAADF-STEM imaging techniques were used to map the nanoparticles and to determine nanoparticle size, crystallinity and existing phases in the cermet layer. For …