Electrical Conductivity of Thin Metallic Films with Unlike Surfaces
作者： M. S. P. Lucas
DOI: 10.1063/1.1703100
关键词: Scattering 、 Electrical resistivity and conductivity 、 Electron 、 Optics 、 Classical and quantum conductivity 、 Mean free path 、 Thermal conduction 、 Conductivity 、 Metal 、 Materials science 、 Condensed matter physics 、 General Physics and Astronomy
摘要: A theoretical analysis, based on the Fuchs‐Sondheimer formalism, is given of conductivity single‐layer, thin metallic films in which scattering conduction electrons different at each surface. The electron‐surface described by parameters P and Q represent fractions specularly scattered Tables normalized resistivity as a function thickness divided mean free path are for various combinations Q.
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sci-hub.se 参考文章(3)
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