TEM observations of radiation damage in tungsten irradiated by 20 MeV W ions

作者: Ł. Ciupiński , O.V. Ogorodnikova , T. Płociński , M. Andrzejczuk , M. Rasiński

DOI: 10.1016/J.NIMB.2013.03.022

关键词: Radiation damageIonIrradiationTungstenMicrostructureFocused ion beamLamella (surface anatomy)CrystallographyAnalytical chemistryTransmission electron microscopyMaterials science

摘要: Abstract Polycrystalline, recrystallized W targets were subjected to implantation with 20 MeV W 6+ ions in order simulate radiation damage caused by fusion neutrons. Three samples cumulative of 0.01, 0.1 and 0.89 dpa produced. The near-surface zone each sample has been analyzed transmission electron microscopy (TEM). To this end, lamellae oriented perpendicularly the implanted surface milled out using focused ion beam (FIB). A reference lamella from non-irradiated, target was also prepared estimate introduced during FIB processing. TEM studies revealed a complex microstructure damaged zones as well its evolution level. experimentally observed depth agrees very one calculated Stopping Range Ions Matter (SRIM) software.

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