X-Ray Photoelectron Diffraction. Possibilities of Surface Structural Analysis
作者： E. V. Shalaeva , M. V. Kuznetsov
DOI: 10.1023/B:JORY.0000009675.42838.DE
关键词: Plane wave 、 X-ray 、 Diffraction 、 Scattering 、 Molecular physics 、 Solid-state physics 、 Optics 、 Adsorption 、 Chemistry 、 Holography 、 Spectroscopy
摘要: The current state of the X-ray photoelectron diffraction (XPD) method and its applications to solid surface chemistry are overviewed in a systematic way. fundamentals presented along with number approaches description: plane wave spherical single scattering approximation, multiple direct s-photoelectron approximation. role initial final states is demonstrated, variants XPD scanning over angles energies described. holography formalism given. Application studies crystals, epitaxial layers, metal–gas adsorption systems adsorbate localized on subsurface layers considered. available experimental data discussed. Photoelectron calculations approximations assessed. bibliography application various
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