Scanning Auger Microscopy Studies on Industrial Ammonia Synthesis Catalysts
作者： M. Weiss , G. Ertl
DOI: 10.1016/S0167-2991(09)61401-4
关键词: Auger electron spectroscopy 、 Chemistry 、 Ammonia production 、 Catalysis 、 Mineralogy 、 Potassium 、 Physical chemistry 、 Overlayer 、 Scanning auger microscopy 、 Lateral resolution
摘要: Resume La composition de surface d'un catalyseur industriel synthese d'ammoniac (BASF S6–10) a ete etudiee au moyen des microscopies electroniques Auger balayage PHI 590 — SAM et 595 SAM, resolution laterale respective 2000 500 A. est fortement enrichie en promoteurs, oxydes Al, K Ca: Al2O3 CaO tendent former particules separees, ce fait agissent comme promoteurs structuraux, alors que le potassium couvre plus ou moins uniformement la fer. nature chimique l'action promotrice du sont discutees relation avec les resultats d'autres techniques, modifications topographie causees par reduction l'empoisonnement soufre decrites. Abstract The of an industrial ammonia synthesis catalyst S6 10) was investigated by means scanning electron microscopy (PHI 590–SAM, resp. 595-SAM), enabling lateral A and A, respectively. promoter oxides Ca are strongly enriched at the surface: tend to form separate particles thus act as ‘structural’ promoters, while covers more or less uniformly Fe areas. chemical action overlayer will be discussed also in view results with other changes topography caused sulfur poisoning described.
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