Characterization of nanocrystalline materials by X-ray line profile analysis
作者： Tamás Ungár , None
DOI: 10.1007/S10853-006-0696-1
关键词: Materials science 、 Dislocation 、 Nanostructure 、 Crystallographic defect 、 Composite material 、 Characterization (materials science) 、 Crystallography 、 Transmission electron microscopy 、 Grain size 、 Nanocrystalline material 、 Microstructure
摘要: X-ray line profile analysis is shown to be a powerful tool characterize the microstructure of nanocrystalline materials in terms grain and subgrain size, dislocation structure densities planar defects, especially stacking faults twin boundaries. It that method can provide valuable complementary information about microstructure, when combined with transmission electron microscopy differential scanning calorimetry.
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