Utilizing multiple test bitstreams to avoid localized defects in partially defective programmable integrated circuits

摘要: Methods and structures utilizing multiple configuration bitstreams to program integrated circuits (ICs) such as programmable logic devices, thereby enabling the utilization of partially defective ICs. A user design is implemented two or more times, preferably different resources much possible in each bitstream. The resulting are stored along with associated test a memory device, e.g., read-only (PROM). Under control circuit loaded into IC tested using an automated testing procedure. When bitstream found that enables function correctly programmed IC, i.e., avoids procedure terminates, begins according design.