作者: Daniel Moulene , Pierre Gourdon
DOI:
关键词: Thermal 、 Ceramic 、 Thermal expansion 、 Mechanical engineering 、 Integrated circuit 、 Wafer 、 Materials science 、 Temperature measurement 、 Electrical resistance and conductance 、 Base (geometry)
摘要: The invention concerns a temperature conditioning support for thermal tests on small objects such as semiconductor wafers incorporating integrated circuits. It consists of platen and hollow base. Inside the cavity is contained serpentine which can convey fluid capable heating and/or cooling to achieve regulation object placed platen, according data supplied by thermometric system that includes sensor associated said support. made electrically insulating thermally conducting ceramic, base being material whose expansion coefficient substantially equal platen. A thin-film electrical resistance be provided ensure and, optionally, measurement