Three‐Dimensional Force Field Spectroscopy

摘要: A method is presented that utilizes the frequency modulation technique in ultra‐high vacuum to measure tip‐sample force field all three dimensions with atomic resolution. It based on a systematic procedure record shift versus distance curves. After their conversion into tip‐surface potential landscape complete can be calculated. Experimental results obtained non‐contact regime NiO(001) an iron‐coated silicon tip are demonstrate interatomic vertical and lateral forces determined assigned specific sites within surface unit cell.