Ti-catalyzed Si nanowires by chemical vapor deposition: Microscopy and growth mechanisms

作者: T. I. Kamins , R. Stanley Williams , D. P. Basile , T. Hesjedal , J. S. Harris

DOI: 10.1063/1.1335640

关键词: Chemical engineeringDeposition (phase transition)Transmission electron microscopyMaterials scienceNanotechnologyChemical vapor depositionNanoparticlePhase (matter)NanowireSiliconTitanium

摘要: Si nanowires grow rapidly by chemical vapor deposition on Ti-containing islands surfaces when an abundant supply of Si-containing gaseous precursor is available. The density wires approximately the same as nucleating surface, although at least two different types appear to correlate with very wire growth rates. For conditions used, a minority long, defect-free form, along more numerous containing defects. Energy-dispersive x-ray spectroscopy shows that nanoparticles remain tip growing wires. estimated diffusion coefficient in TiSi2 consistent catalyzing nanoparticle remaining solid phase during nanowire growth.

参考文章(23)
Shyam P Murarka, Silicides for VLSI applications Elsevier. ,(1983)
Thaddeus B Massalski, Hiroaki Okamoto, PRnbsp Subramanian, Linda Kacprzak, William W Scott, None, Binary alloy phase diagrams ASM International. ,vol. 3, pp. 2874- ,(1986)
R. P. Southwell, E. G. Seebauer, A Predictive Kinetic Model for the Chemical Vapor Deposition of TiSi2 Journal of The Electrochemical Society. ,vol. 143, pp. 1726- 1736 ,(1996) , 10.1149/1.1836708
N. de Lanerolle, B. Kim, L. Moser, Y. Zheng, D. Sterner, J. Berg, Titanium silicide-silicon interface degradation during heat treatment Journal of Electronic Materials. ,vol. 19, pp. 1185- 1192 ,(1990) , 10.1007/BF02673331
R. S. Wagner, W. C. Ellis, K. A. Jackson, S. M. Arnold, Study of the Filamentary Growth of Silicon Crystals from the Vapor Journal of Applied Physics. ,vol. 35, pp. 2993- 3000 ,(1964) , 10.1063/1.1713143
L. S. Hung, J. Gyulai, J. W. Mayer, S. S. Lau, M‐A. Nicolet, Kinetics of TiSi2 formation by thin Ti films on Si Journal of Applied Physics. ,vol. 54, pp. 5076- 5080 ,(1983) , 10.1063/1.332781
Akihiko Ishitani, Hiroshi Kitajima, Nobuhiro Endo, Naoki Kasai, Facet Formation in Selective Silicon Epitaxial Growth Japanese Journal of Applied Physics. ,vol. 24, pp. 1267- 1269 ,(1985) , 10.1143/JJAP.24.1267
Thom Sandwick, Krishna Rajan, The oxidation of titanium silicide Journal of Electronic Materials. ,vol. 19, pp. 1193- 1199 ,(1990) , 10.1007/BF02673332
R. P. Southwell, E. G. Seebauer, Kinetics of TiSi2 Formation and Silicon Consumption during Chemical Vapor Deposition Journal of The Electrochemical Society. ,vol. 144, pp. 2122- 2137 ,(1997) , 10.1149/1.1837751
L. Csepregi, J. W. Mayer, T. W. Sigmon, Regrowth behavior of ion‐implanted amorphous layers on 〈111〉 silicon Applied Physics Letters. ,vol. 29, pp. 92- 93 ,(1976) , 10.1063/1.88980