Investigation of Fermi-level pinning at silicon/porous-silicon interface by vibrating capacitor and surface photovoltage measurements

作者: J. Mizsei , J.A. Shrair , I. Zólomy

DOI: 10.1016/J.APSUSC.2004.05.110

关键词: Band bendingOptoelectronicsAnalytical chemistryFermi levelMaterials sciencePorous siliconSiliconRectangular potential barrierSurface photovoltageWork functionCharge carrier

摘要: … The backside of the semiconductor is also connected to the ground, thus its Fermi-level … surface photovoltage by vibrating capacitor with static light and static capacitor with pulsed light …

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