Interrelation between Substrate Roughness and Thin-Film Structure of Functionalized Acenes on Graphite

作者: Tobias Breuer , Ingo Salzmann , Jan Götzen , Martin Oehzelt , Antonia Morherr

DOI: 10.1021/CG200894Y

关键词: Highly oriented pyrolytic graphiteSurface finishSubstrate (electronics)PerfluoropentaceneChemical engineeringCrystal structureNanotechnologyGraphiteThin filmExfoliation jointMaterials science

摘要: Using atomic force microscopy (AFM) and X-ray diffraction (XRD), we analyzed the growth of differently modified pentacenes (perfluoropentacene pentacenetetrone) on graphite demonstrate that both resulting morphology crystalline structure films critically depend microroughness substrate. On well-ordered highly oriented pyrolytic (HOPG) surfaces prepared by exfoliation, molecular materials form exceptionally smooth films, which consist large-area molecularly flat islands yielding an overall low roughness. Interestingly, in these molecules adopt a recumbent orientation, while defective substrates, created brief ion sputtering, upright orientation nonconnected exhibiting significantly increased film Our study not only underlines possibility to prepare very weakly interacting substrate but also emphasizes importance proper preparation signif...

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