An accurate microdisc simulation model for recessed microdisc electrodes

摘要: Abstract This study concentrates on an accurate determination of the chronoamperometric response for shallow and deep recessed microdiscs. Diffusion to microdisc is simulated using finite element method (FEM). The deviation a microelectrode from that corresponding inlaid can be significant depending recess depth. noted in terms magnitude shape curves. We find cottrellian current decay microdiscs at short times “switching” steady-state behaviour long times. switch over becomes sharper as depth increases. previously proposed approximate expressions also discussed, with emphasis deviations simulation model developed here yielding transient steady state values. Approximate analytical which used calculate responses electrodes are presented.