Post-mortem analysis of tungsten plasma facing components in tokamaks: Raman microscopy measurements on compact, porous oxide and nitride films and nanoparticles

摘要: Raman microscopy is one of the methods that could be used for future post-mortem analyses ITER plasma facing components samples. This study shows useful studying tungsten-based materials containing impurities including oxides and nitrides. Here, we apply pulsed laser deposition DC argon glow discharges to produce tungsten-containing synthetic films (compact, porous) nanoparticles investigate influence their morphology on measured spectra. The amounts oxygen and/or nitrogen in are also investigated. Comparative data obtained by X-ray Photoelectrons Spectroscopy, Atomic Force Microscopy, Electron Microscopies (Scanning Transmission), Energy Dispersive spectroscopy, Time-of-Flight Elastic Recoil Detection Analysis. power density beam perform varied up 4 orders magnitude (0.01-20 mW/μm2) found very helpful thermal stability nanoparticles. As a first result, give evidence sensitive enough detect surface native oxides. Secondly, more tungsten detected porous than compact films, band intensities being correlated content. Thirdly, these (i.e. structural chemical modification under heating) lowered when contain sufficiently large amount nitrogen. finding suggests can substituted during induced heating occurring ambient air. Finally, our methodology rapidly characterize chemistry samples analyzed, create at micrometer scale.