X-ray topographic study of β-NiAl upon growth of an α-Al 2 O 3 film
作者： T. Homma , H. M. Hindam , Y. Pyun , W. W. Smeltzert
DOI: 10.1007/BF00738384
关键词: Crystallography 、 Diffraction 、 Materials science 、 Metal 、 Oxide 、 Metallic materials 、 X-ray 、 Substructure 、 Nial
摘要: The Berg-Barrett X-ray topographic method was employed as a microstructural technique to seek correlations of the metal substructure morphological features α-Al2O3 films grown on β-NiAl. An analysis diffraction micrographs using {112} and {002} reflections from individual grains in β-NiAl revealed its subgrain structure depth 30 μ. dimensions these subgrains were directly related density oxide ridges shapes cavities at NiAl-Al2O3 interface.
springer.com
sci-hub.se 参考文章(9)
Charles S. Barrett, Structure of Metals ,(2007)
Bernard Dennis Cullity, Elements of X-ray diffraction ,(1956)
H. M. Hindam, W. W. Smeltzer, Application of auger electron spectroscopy and inert metal marker techniques to determine metal and oxygen transport in oxide films on metals Oxidation of Metals. ,vol. 14, pp. 337- 349 ,(1980) , 10.1007/BF00603789
R. Hutchings, M. H. Loretto, R. E. Smallman, Oxidation of intermetallic compound NiAI Metal science. ,vol. 15, pp. 7- 13 ,(1981) , 10.1179/MSC.1981.15.1.7
James L. Smialek, Oxide morphology and spalling model for NiAl Metallurgical and Materials Transactions A-physical Metallurgy and Materials Science. ,vol. 9, pp. 309- 320 ,(1978) , 10.1007/BF02646380
Y. Oishi, W. D. Kingery, Self‐Diffusion of Oxygen in Single Crystal and Polycrystalline Aluminum Oxide The Journal of Chemical Physics. ,vol. 33, pp. 480- 486 ,(1960) , 10.1063/1.1731170
A. E. Paladino, W. D. Kingery, Aluminum Ion Diffusion in Aluminum Oxide The Journal of Chemical Physics. ,vol. 37, pp. 957- 962 ,(1962) , 10.1063/1.1733252
J. W. Rutter, B. Chalmers, A PRISMATIC SUBSTRUCTURE FORMED DURING SOLIDIFICATION OF METALS Canadian Journal of Physics. ,vol. 31, pp. 15- 39 ,(1953) , 10.1139/P53-003
H. M. Hindam, W. W. Smeltzer, Growth and Microstructure of α ‐ Al2 O 3 on β ‐ NiAl Journal of The Electrochemical Society. ,vol. 127, pp. 1630- 1635 ,(1980) , 10.1149/1.2129965