作者: Stephen Ducharme , Z. Xiao , Shashi Poddar , X. Hong
DOI: 10.1063/1.4820784
关键词: Surface finish 、 Exponent 、 Materials science 、 Condensed matter physics 、 Ferroelectricity 、 Domain wall (magnetism) 、 Creep 、 Nanoscopic scale 、 Ferroelectric polymers 、 Polarization (electrochemistry)
摘要: We report piezo-response force microscopy studies of the static and dynamic properties domain walls (DWs) in 11 to 36 nm thick films crystalline ferroelectric poly(vinylidene-fluoride-trifluorethylene). The DW roughness exponent {\zeta} ranges from 0.39 0.48 creep {\mu} varies 0.20 0.28, revealing an unexpected effective dimensionality ~1.5 that is independent film thickness. Our results suggest predominantly 2D ferroelectricity layered polymer we attribute fractal deroughening due correlations between in-plane out-of-plane polarization, effect can be exploited achieve high lateral density for developing nanoscale ferroelectrics-based applications.