Apparatus for Detecting Sample Properties Using Chaotic Wave Sensor
作者： YongKeun Park , KyeoReh Lee , Jonghee Yoon , Nam Kyun Kim , Young Dug Kim
DOI:
关键词: Speckle pattern 、 Physics 、 Detector 、 Temporal correlation 、 Chaotic 、 Controller (computing) 、 Optics 、 Sample (graphics)
摘要: Provided is a sample property detecting apparatus including: wave source configured to irradiate towards sample; detector detect laser speckle that generated when the multiple-scattered by sample, at every time point set in advance; and controller obtain temporal correlation variation detected according time, properties of real-time based on correlation, wherein detects between or from region detector.
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