Computation of electron diffraction patterns in Lorentz electron microscopy of thin magnetic films

摘要: Lorentz electron microscopy is a powerful tool for high‐resolution studies of magnetic structure in thin films.1–3 The physical mechanism that underlies all known modes the interaction between propagating wave and vector potential field. For given trajectory interaction, commonly as Aharonov–Bohm effect, results phase delay directly proportional to path integral potential.4 therefore branch phase‐contrast whose various (e.g., Fresnel, Foucault, differential contrast, small‐angle diffraction, interference, holography) simply represent different designs capturing information contained beam after passage through sample. This paper introduces general technique computing imparted by two‐dimensional pattern magnetization. field film with arbitrary ...