Orthogonality catastrophe and the x-ray photoemission spectrum: Critical amplitude at finite temperatures.

作者: Y. Tanabe

DOI: 10.1103/PHYSREVB.33.2806

关键词: Spectrum (functional analysis)AmplitudeOrthogonalityAngle-resolved photoemission spectroscopyAtomic physicsInverse photoemission spectroscopyCondensed matter physicsX ray photoemissionPhysics

摘要:

参考文章(4)
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Y. Tanabe, K. Ohtaka, Orthogonality catastrophe and the x-ray photoemission spectrum Physical Review B. ,vol. 32, pp. 2036- 2048 ,(1985) , 10.1103/PHYSREVB.32.2036