作者: Chuanxiao Xiao , Chun-Sheng Jiang , Weijun Ke , Changlei Wang , Brian Gorman
DOI: 10.1109/PVSC.2016.7749804
关键词: Microscopy 、 Hysteresis 、 Nanometre 、 Kelvin probe force microscope 、 Fullerene 、 Layer (electronics) 、 Solar cell 、 Chemistry 、 Nanotechnology 、 Perovskite (structure) 、 Optoelectronics
摘要: We used Kelvin probe force microscopy to study the potential distribution on cross-section of perovskite solar cells with different types electron-transporting layers (ETLs). Our results explain low open-circuit voltage and fill factor in ETL-free cells, support fact that intrinsic SnO 2 as an alternative ETL material can make high-performance devices. Furthermore, potential-profiling indicate a reduction junction-interface recombination by optimized layer adding fullerene layer, which is consistent improved device performance current-voltage hysteresis.