Nanomechanical probing of layered nanoscale polymer films with atomic force microscopy

摘要: The approach developed for the microindentation of layered elastic solids was adapted to analyze atomic force microscopy probing ultrathin (1–100 nm-thick) polymer films on a solid substrate. model analyzing extended construct two- and tri-step graded functions with transition zones accounting variable gradient between layers. This “graded” offered transparent consideration mechanical properties Several examples recent applications this nanoscale layers were presented. We considered moduli ranging from 0.05 3000 MPa different architecture in dry state solvated state. most sophisticated case tri-layered film thickness 20–50 nm also successfully treated within approach. In all cases, complex shape corresponding loading curves modulus depth profiles obtained experimental data fitted by nanomechanical parameters (elastic zone widths) close independently determined microstructural (thickness composition layers) materials.