Modeling of Anisotropic Two-Dimensional Materials Monolayer HfS2 and Phosphorene MOSFETs

作者: Jiwon Chang

DOI: 10.1063/1.4921806

关键词: Length scaleBallistic conductionPhysicsField-effect transistorScalingSemiconductorMonolayerPhosphoreneCondensed matter physicsAnisotropy

摘要: Ballistic transport characteristics of metal-oxide semiconductor field effect transistors (MOSFETs) based on anisotropic two-dimensional (2-D) materials monolayer HfS2 and phosphorene are explored through quantum simulations. We focus the effects channel crystal orientation length scaling device performances. Especially, role degenerate conduction band (CB) valleys in is comprehensively analyzed. Benchmarking with MOSFETs, we predict that performances much weaker than due to CB HfS2. Our simulations also reveal that, at 10 nm scale, MOSFETs outperform terms onstate current. However, it observed may offer comparable, but a little bit degraded, as compared 5 length.

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