作者: Maxim Zaitsev , David John Collins , James D'arcy , Martin Osmund Leach , Joni N. Shah
DOI:
关键词: EPIC 、 Mathematics 、 Keyhole 、 Space (mathematics) 、 Spatial frequency 、 T2 contrast 、 Echo-planar imaging 、 Optics
摘要: The invention relates to a method for examining at least one object during which properties of the are detected different times within spatial frequency space formed by frequencies. According invention, is carried out in such manner that temporally consecutive recordings ensue overlapping regions and additionally differ from another.