作者: A. Tebano , C. Aruta , S. Sanna , P. G. Medaglia , G. Balestrino
DOI: 10.1103/PHYSREVLETT.100.137401
关键词: Substrate (electronics) 、 Condensed matter physics 、 Dipole 、 Diffraction 、 Double-exchange mechanism 、 Absorption (chemistry) 、 Linear dichroism 、 Materials science 、 Magnetization 、 Orbital reconstruction
摘要: Linear dichroism (LD) in x-ray absorption, diffraction, transport, and magnetization measurements on thin La 0.7 Sr 0.3 MnO 3 films grown different substrates, allow identification of a peculiar interface effect, related just to the presence interface. We report LD signature preferential 3d - e g (3z 2 r ) occupation at interface, suppressing double exchange mechanism. This surface orbital reconstruction is opposite that favored by residual strain independent dipolar fields, chemical nature substrate capping layers.