作者: Gary L. Kinsland , William A. Bassett
DOI: 10.1063/1.1134460
关键词: Radiation 、 Crystallite 、 Diamond 、 Beam (structure) 、 Strain (chemistry) 、 Perpendicular 、 Diffraction 、 Optics 、 Materials science 、 Strength of materials 、 Instrumentation (computer programming)
摘要: A diamond anvil cell has been adapted for determination of the strain ellipsoid in a polycrystalline sample. An x‐ray beam (Mo Kα) is directed through sample perpendicular to loading axis. Since anvils are transparent Mo Kα radiation, complete cone diffraction available from each set crystallographic planes (hkl). These cones produce rings on flat film placed front reflection geometry. From ellipticity these it possible calculate directly ellipsoid. Material strengths as function pressure can then be calculated.