作者: A. Di Cicco , E. Principi , M. Minicucci , S. De Panfilis , A. Filipponi
DOI: 10.1080/08957950410001661864
关键词: Amorphous solid 、 X-ray absorption spectroscopy 、 Materials science 、 Analytical chemistry 、 Diffraction 、 Extended X-ray absorption fine structure 、 X-ray crystallography 、 Absorption spectroscopy 、 Crystallization 、 Diamond anvil cell
摘要: Results of experiments dedicated to the study structure under high pressure amorphous Ge (a-Ge) and crystalline (c-Ge) are reported. Energy-dispersive X-ray diffraction measurements c-Ge have been collected at DW11A beamline (DCI, LURE) using a heatable diamond anvil cell as device up 500 K. The a-Ge performed ESRF, advanced set-up available BM29 beamline, which allows simultaneous collection absorption spectroscopy data patterns used monitor crystallization sample in Paris–Edinburgh large-volume cell. new structural allowed us obtain reliable determination lattice parameters function temperature first-neighbor distance distribution a-Ge.