Atomic Force Microscopy (AFM)
作者： Gernot Friedbacher
DOI: 10.1002/9783527636921.CH29
关键词: Conductive atomic force microscopy 、 Scanning ion-conductance microscopy 、 Polymer characterization 、 Nanotechnology 、 Kelvin probe force microscope 、 Self-assembled monolayer 、 Force spectroscopy 、 Magnetic force microscope 、 Materials science 、 Scanning capacitance microscopy
摘要:
sci-hub.se 参考文章(53)
Pierre‐Emmanuel Mazeran, Jean‐Luc Loubet, Normal and lateral modulation with a scanning force microscope, an analysis: implication in quantitative elastic and friction imaging Tribology Letters. ,vol. 7, pp. 199- 212 ,(1999) , 10.1023/A:1019142025011
O. Piétrement, J.L. Beaudoin, M. Troyon, A new calibration method of the lateral contact stiffness and lateral force using modulated lateral force microscopy Tribology Letters. ,vol. 7, pp. 213- 220 ,(1999) , 10.1023/A:1019150226828
Jeffrey M. Mativetsky, Matteo Palma, Paolo Samorì, Exploring electronic transport in molecular junctions by conducting atomic force microscopy. Topics in Current Chemistry. ,vol. 285, pp. 157- 202 ,(2008) , 10.1007/128_2007_25
C. Mathew Mate, Gary M. McClelland, Ragnar Erlandsson, Shirley Chiang, Atomic-scale friction of a tungsten tip on a graphite surface. Physical Review Letters. ,vol. 59, pp. 1942- 1945 ,(1987) , 10.1103/PHYSREVLETT.59.1942
Jane Frommer, Rastertunnel- und Kraftmikroskopie in der Organischen Chemie Angewandte Chemie. ,vol. 104, pp. 1325- 1357 ,(1992) , 10.1002/ANGE.19921041006
K Kimura, K Kobayashi, H Yamada, K Matsushige, High resolution molecular chain imaging of a poly(vinylidenefluoride-trifluoroethylene) crystal using force modulation microscopy Nanotechnology. ,vol. 18, pp. 305504- ,(2007) , 10.1088/0957-4484/18/30/305504
T. Göddenhenrich, S. Müller, C. Heiden, A lateral modulation technique for simultaneous friction and topography measurements with the atomic force microscope Review of Scientific Instruments. ,vol. 65, pp. 2870- 2873 ,(1994) , 10.1063/1.1144630
Jan H. Hoh, Jason P. Cleveland, Craig B. Prater, Jean Paul Revel, Paul K. Hansma, Quantized adhesion detected with the atomic force microscope Journal of the American Chemical Society. ,vol. 114, pp. 4917- 4918 ,(1992) , 10.1021/JA00038A075
I. Schmitz, M. Schreiner, G. Friedbacher, M. Grasserbauer, Phase imaging as an extension to tapping mode AFM for the identification of material properties on humidity-sensitive surfaces Applied Surface Science. ,vol. 115, pp. 190- 198 ,(1997) , 10.1016/S0169-4332(97)80204-8
Helen G Hansma, None, Atomic force microscopy of biomolecules Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. ,vol. 14, pp. 1390- 1394 ,(1996) , 10.1116/1.589105