Diffraction analysis of the microstructure of materials

作者：

关键词: Materials science 、 Amorphous solid 、 Texture (crystalline) 、 Crystallite 、 Composite material 、 Nanocrystalline material 、 Rietveld refinement 、 Diffraction 、 Crystallography 、 Dislocation 、 Powder diffraction

摘要: 1 Line Profile Analysis: A Historical Overview.- 2 Convolution Based Fitting.- 3 Whole Powder Pattern Modelling: Theory and Applications.- 4 Full Analysis of X-ray Diffraction Patterns for Investigation Nanocrystalline Systems.- 5 Crystallite Size Residual Strain/Stress Modeling in Rietveld Refinement.- 6 The Quantitative Determination the Crystalline Amorphous Content by Method: Application to Glass Ceramics with Different Absorption Coefficients.- 7 Fraction Study Microstructure Semi-crystalline Materials.- 8 Bayesian/Maximum Entropy Method Certification a Nanocrystallite-Size NIST Standard Reference Material.- 9 Submicrocrystalline Materials Diffuse Scattering Transmitted Wave.- 10 Determining Dislocation Contrast Factor Analysis.- 11 Peak Broadening Due Inhomogeneous Distributions.- 12 Non-uniform Distributions Polycrystalline 13 Fitting: Case fcc Crystals Containing Stacking Faults.- 14 Elastic Constants Stress Factors Grain Interaction Macroscopically Elastically Anisotropic Solids Thin Films.- 15 between Phases Co-deforming Two-Phase Materials: Role Arrangements.- 16 Surface Relaxation Effects Diffraction.- 17 Interface 18 Problems Related X-Ray Films Presence Gradients Texture.- 19 Two-Dimensional XRD Modelling Imperfect Epitaxial Layers.- 20 Three-Dimensional Reciprocal Space Mapping: CVD Diamond.