作者: Roger A. Quon , John M. Levins , T.Kyle Vanderlick
关键词: Process (computing) 、 Wavelength 、 Interferometry 、 Computer science 、 Measure (physics) 、 Surface (mathematics) 、 Interference (wave propagation) 、 Field of view 、 Surface forces apparatus 、 Optics
摘要: Abstract Multiple beam interferometry is a simple, yet powerful, technique that can be used to determine changes in the distance between two surfaces; under optimal conditions, resolution of measurement less than 1 A. utilized effectively conjunction with surface forces apparatus measure acting opposed surfaces as function their separation. The conventional method based on visual observations interference fringes which shift continuously wavelength varied. Data collection slow and demanding process, precision limited by both skill stamina experimenter. We report here an automated system designed wavelengths produced typical experiment. obtained exceeds manual method, while time required comparable. distinguishing feature our development implementation versatile algorithm quantify shapes fringes. Capabilities are not afforded include accurate curve fits observed simultaneous measurements all field view.